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Modern embedded appliances already integrate a multitude of functionalities with potentially different criticality levels into a single system and this trend is expected to grow in the near future. The integration of multiple functions with different criticality and certification assurance levels on a shared computing platform constitutes a mixed-criticality system (MCS). Mixed-criticality systems range from lowest assurance requirements up to the highest criticality levels (e.g., DAL A in RTCA DO-178B or SIL4 in EN ISO/IEC 61508). In many domains such as automotive, avionics and industrial control, the economic success depends on the ability to design, implement, qualify and certify advanced real-time embedded systems within bounded time, effort and costs. Without appropriate preconditions, the integration of mixed-criticality subsystems can lead to a significant and potentially unacceptable increase of engineering and certification costs. There are several ongoing research initiatives studying mixed-criticality integration in single and multicore processors, as well as on distributed systems. Key challenges are the combination of software virtualization and hardware segregation and the extension of partitioning mechanisms jointly addressing significant extra-functional requirements (e.g., time, energy and power budgets, adaptivity, reliability, safety, security, volume, weight, etc.) along with a proven development and certification methodology. To support the design and implementation of mixed-criticality systems, new design techniques and tools for the analysis of extra-functional properties are required.
Topics of interest include, but are not limited to, the following:
Kim Grüttner (OFFIS, DE) – chair
Mikel Azkarate-Askatsua (IK4-IKERLAN, ES) – co-chair
Mikel Azkarate-askatsua (IK4-IKERLAN, ES)
Sanjoy Baruah (U North Carolina, USA)
Gedare Bloom (George Washington U, USA)
Francisco J. Cazorla (BSC & IIIA-CSIC, ES)
Alfons Crespo (UPV & FentISS, ES)
William Fornaciari (Politecnico di Milano, IT)
Kees Goossens (TU/e, NL)
Kim Grüttner (OFFIS, DE)
Philipp A. Hartmann (Intel, DE)
Xabier Iturbe (ARM. GB)
Renato Mancuso (Boston University, USA)
Silvia Mazzini (INTECS, IT)
Julio Medina (U Cantabria, ES)
Roman Obermaisser (U Siegen, DE)
Michael Paulitsch (Intel, DE)
Ingo Sander (KTH, SE)
Andreas von Schwerin (Siemens, DE)
Ingo Stierand (OFFIS, DE)
Jean-Loup Terraillon (ESA, NL)
Sascha Uhrig (Airbus, DE)
Eugenio Villar (U Cantabria, ES)
Heechul Yun (University of Kansas, USA)